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| ArticleName | Mechanisms of the relaxation process of residual thermal microvoltage in beryllium |
| ArticleAuthor | Tuzov Yu. V., Homutov A. M. |
| ArticleAuthorData | Homutov A. M., amxom@rambler.ru |
| Abstract | Possible mechanisms of a relaxation process of residual thermal microvoltage in beryllium powder are analysed. It is shown that the main contribution to relaxation brings dislocation sliding in a combination to rotary modes of deformation. Intensity of these processes depends on cleanliness of metal and dispersion grain-adjoining inclusions of oxide and intermetallic compounds. These factors easily give into management under of existend technology of beryllium powder. |
| keywords | Dislocation, beryllium, relaxation, residual thermal micro-voltage, hexagonal axis, deformation. |
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| Language of full-text | russian |
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