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Magnesium, titanium, rare metals, semiconductors
ArticleName Determination of the impurity content in the vanadium pentaoxide powders by inductively coupled plasma atomic emission spectrometry
ArticleAuthor Volchenkova V. A., Kazenas E. K., Goncharenko T. V., Kryazhkov I. I., Ovchinnikova O. A.
ArticleAuthorData V. A. Volchenkova, Leading Researcher, e-mail: volch.v.a@mail. ru; E. K. Kazenas, Head of Analytical Laboratory; T. V. Goncharenko, Senior Researcher of Laboratory of Metallurgy of Complex Ore Problems; I. I. Kryazhkov, Engineer-Researcher of Analytical Laboratory; O. A. Ovchinnikova, Senior Researcher of Analytical Laboratory, The Baykov Institute of Metallurgy and Material Science of the Russian Academy of Sciences. N. A. Andreeva, N. N. Dergunova, A. P. Degtyareva, A. K. Paunov, T. N. Penkina, S. K. Rodionova, V. B. Smirnova, A. A. Fomina, V. N. Yashukova took part in the paper.
Abstract
Procedures of the impurities (Al, As, Ca, Cr, Fe, K, Mg, Mn, Mo, Na, Si, Ti) determination in vanadium pentaoxide powders have been developed applying inductively coupled plasma atomic emission spectrometry. New procedures allow to carry out an express analysis of samples and to determine impurities (without preliminary matrix separation) from 0.001 to n % with good metrological characteristics. Relative standard deviation (Sr) does not exceed 0.06.
keywords Vanadium pentaoxide, powders, impurity, analysis, samples, inductively coupled plasma atomic emission spectrometry.
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